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Temperature dependence of the width of the deep-level band in silicon with a high concentration of defects

✍ Scribed by J. Partyka; P. W. Žukowski; P. Wegierek; A. Rodzik; Yu. V. Sidorenko; Yu. A. Shostak


Book ID
110133126
Publisher
Springer
Year
2002
Tongue
English
Weight
73 KB
Volume
36
Category
Article
ISSN
1063-7826

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