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TEM, XRD and AFM study of poly(o-ethoxyaniline) films: new

✍ Scribed by Fabio L. Leite; William F. Alves; Mirta Mir; Yvonne P. Mascarenhas; Paulo S. P. Herrmann; Luiz H. C. Mattoso; Osvaldo N. Oliveira

Publisher
Springer
Year
2008
Tongue
English
Weight
748 KB
Volume
93
Category
Article
ISSN
1432-0630

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