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TEM characterization of Si films grown on 6H–SiC (0001) C-face

✍ Scribed by Li, Lianbi; Chen, Zhiming; Xie, Longfei; Yang, Chen

Book ID: 123387577
Publisher: Elsevier Science
Year: 2013
Tongue: English
Weight: 419 KB
Volume: 93
Category: Article
ISSN: 0167-577X
DOI: 10.1016/j.matlet.2012.11.093

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