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A TEM Evaluation of ELOG GaN Grown on AlN Buffer Layer by HVPE on (0001) 6H-SiC

✍ Scribed by P. Ruterana; B. Beaumont; P. Gibart; Yu. Melnik

Publisher: John Wiley and Sons
Year: 1999
Tongue: English
Weight: 202 KB
Volume: 216
Category: Article
ISSN: 0370-1972
DOI: 10.1002/(sici)1521-3951(199911)216:1<697::aid-pssb697>3.0.co;2-l

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