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Technology Scaling Comparison of Flip-Flop Heavy-Ion Single-Event Upset Cross Sections

✍ Scribed by Gaspard, N. J.; Jagannathan, S.; Diggins, Z. J.; King, M. P.; Wen, S-J.; Wong, R.; Loveless, T. D.; Lilja, K.; Bounasser, M.; Reece, T.; Witulski, A. F.; Holman, W. T.; Bhuva, B. L.; Massengill, L. W.

Book ID: 121808078
Publisher: IEEE
Year: 2013
Tongue: English
Weight: 955 KB
Volume: 60
Category: Article
ISSN: 0018-9499
DOI: 10.1109/TNS.2013.2289745

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