Heavy Ion Testing and Single Event Upset Rate Prediction Considerations for a DICE Flip-Flop

✍ Scribed by Warren, Kevin M.; Sternberg, Andrew L.; Black, Jeffrey D.; Weller, Robert A.; Reed, Robert A.; Mendenhall, Marcus H.; Schrimpf, Ronald D.; Massengill, Lloyd W.

• Book ID: 127103878
• Publisher: IEEE
• Year: 2009
• Tongue: English
• Weight: 576 KB
• Volume: 56
• Category: Article
• ISSN: 0018-9499
• DOI: 10.1109/tns.2009.2034146