Neutron- and Proton-Induced Single Event Upsets for D- and DICE-Flip/Flop Designs at a 40 nm Technology Node

✍ Scribed by Loveless, T D; Jagannathan, S; Reece, T; Chetia, J; Bhuva, B L; McCurdy, M W; Massengill, L W; Wen, S-J; Wong, R; Rennie, D

• Book ID: 120207434
• Publisher: IEEE
• Year: 2011
• Tongue: English
• Weight: 470 KB
• Volume: 58
• Category: Article
• ISSN: 0018-9499
• DOI: 10.1109/TNS.2011.2123918