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Technological and physical aspects of the main EL2 defect in GaAs

✍ Scribed by M. Kaminśka; M. Skowroński; W. Kuszko; J. Lagowski; J. Parsey; H. C. Gatos

Book ID: 112567664
Publisher: Springer
Year: 1984
Tongue: English
Weight: 329 KB
Volume: 34
Category: Article
ISSN: 0011-4626
DOI: 10.1007/bf01590082

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