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Tapping Mode Imaging and Measurements with an Inverted Atomic Force Microscope

✍ Scribed by Chan, Sandra S. F.; Green, John-Bruce D.

Book ID: 126034273
Publisher: American Chemical Society
Year: 2006
Tongue: English
Weight: 272 KB
Volume: 22
Category: Article
ISSN: 0743-7463
DOI: 10.1021/la060002i

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