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Manipulation, dissection, and lithography using modified tapping mode atomic force microscope

✍ Scribed by Zhiguo Liu; Zhuang Li; Gang Wei; Yonghai Song; Li Wang; Lanlan Sun


Publisher
John Wiley and Sons
Year
2006
Tongue
English
Weight
311 KB
Volume
69
Category
Article
ISSN
1059-910X

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✦ Synopsis


Abstract

A modified tapping mode of the atomic force microscope (AFM) was introduced for manipulation, dissection, and lithography. By sufficiently decreasing the amplitude of AFM tip in the normal tapping mode and adjusting the setpoint, the tip‐sample interaction can be efficiently controlled. This modified tapping mode has some characteristics of the AFM contact mode and can be used to manipulate nanoparticles, dissect biomolecules, and make lithographs on various surfaces. This method did not need any additional equipment and it can be applied to any AFM system. Microsc. Res. Tech., 2006. © 2006 Wiley‐Liss, Inc.


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