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Tailoring the stress-depth profile in thin films; the case of γ’-Fe4N1-x

✍ Scribed by M. Wohlschlögel; U. Welzel; E.J. Mittemeijer

Book ID: 113937185
Publisher: Elsevier Science
Year: 2011
Tongue: English
Weight: 546 KB
Volume: 520
Category: Article
ISSN: 0040-6090
DOI: 10.1016/j.tsf.2011.07.070

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