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System integration of the ITER switching networks, fast discharge units and busbars

✍ Scribed by Francesco Milani; Alexander Roshal; Ivone Benfatto; Inho Song; Jeff Thomsen


Book ID
116496595
Publisher
Elsevier Science
Year
2011
Tongue
English
Weight
344 KB
Volume
86
Category
Article
ISSN
0920-3796

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[ACM Press the 19th annual symposium - O
✍ Frantz, Arthur Pereira; Kastensmidt, Fernanda Lima; Carro, Luigi; Cota, Γ‰rika πŸ“‚ Article πŸ“… 2006 πŸ› ACM Press 🌐 English βš– 261 KB

As the complexity of designs increases and the technology scales down into the deep sub-micron domain, devices and interconnections are subject to new types of malfunctions and failures. This work intends to evaluate the effect of Single Event Upsets (SEUs) and crosstalk faults in a Network-on-Chip