As the complexity of designs increases and the technology scales down into the deep sub-micron domain, devices and interconnections are subject to new types of malfunctions and failures. This work intends to evaluate the effect of Single Event Upsets (SEUs) and crosstalk faults in a Network-on-Chip
✦ LIBER ✦
[ACM Press the 19th annual symposium - Ouro Preto, MG, Brazil (2006.08.28-2006.09.01)] Proceedings of the 19th annual symposium on Integrated circuits and systems design - SBCCI '06 - Evaluation of SEU and crosstalk effects in network-on-chip switches
✍ Scribed by Frantz, Arthur Pereira; Kastensmidt, Fernanda Lima; Carro, Luigi; Cota, Érika
- Book ID
- 118165598
- Publisher
- ACM Press
- Year
- 2006
- Weight
- 261 KB
- Volume
- 0
- Category
- Article
- ISBN-13
- 9781595934796
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