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[ACM Press the 19th annual symposium - Ouro Preto, MG, Brazil (2006.08.28-2006.09.01)] Proceedings of the 19th annual symposium on Integrated circuits and systems design - SBCCI '06 - Evaluation of SEU and crosstalk effects in network-on-chip switches

✍ Scribed by Frantz, Arthur Pereira; Kastensmidt, Fernanda Lima; Carro, Luigi; Cota, Érika

Book ID
118165599
Publisher
ACM Press
Year
2006
Tongue
English
Weight
261 KB
Volume
0
Category
Article
ISBN-13
9781595934796

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✦ Synopsis

As the complexity of designs increases and the technology scales down into the deep sub-micron domain, devices and interconnections are subject to new types of malfunctions and failures. This work intends to evaluate the effect of Single Event Upsets (SEUs) and crosstalk faults in a Network-on-Chip switch by performing fault injection simulations, allowing an accurate analysis of the impact of these faults over the switch service. The results show that such faults might affect the switch behavior, with errors ranging from simple loss of packets up to the permanent interruption of the switch service.

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