Symmetries of hydrogen-bonded enol forms of diketones as determined by x-ray photoelectron spectroscopy
โ Scribed by Brown, R. S.; Tse, A.; Nakashima, T.; Haddon, R. C.
- Book ID
- 120567046
- Publisher
- American Chemical Society
- Year
- 1979
- Tongue
- English
- Weight
- 736 KB
- Volume
- 101
- Category
- Article
- ISSN
- 0002-7863
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## Silicon with thermally-grown oxide overlayers m the thickness range IS-89 A IS studied by angulardcpendent XPS. Electron attenuation lengths at 1382 eV are found to be 37 +-4 A in SiOz and 27 +-6 A in Si. Single-crystal effects and thin-layer anomalies are also discussed.
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