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Surface sensitivity and angular dependence of X-ray photoelectron spectra

✍ Scribed by W.A. Fraser; J.V. Florio; W.N. Delgass; W.D. Robertson

Book ID: 118980770
Publisher: Elsevier Science
Year: 1973
Tongue: English
Weight: 832 KB
Volume: 36
Category: Article
ISSN: 0039-6028
DOI: 10.1016/0039-6028(73)90410-x

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## Abstract X‐ray (XS) and X‐ray photoelectron (XPS) spectra are reported for vanadium oxides. Because of the multivalent character of vanadium in the oxide system high quality measurements can be used for chemical shift investigation. Both inner level and valence band spectroscopy give information