𝔖 Bobbio Scriptorium
✦   LIBER   ✦

Angular dependence of X-ray photoelectrons

✍ Scribed by J. Brunner; H. Zogg


Publisher
Elsevier Science
Year
1974
Tongue
English
Weight
475 KB
Volume
5
Category
Article
ISSN
0368-2048

No coin nor oath required. For personal study only.


πŸ“œ SIMILAR VOLUMES


Properties of oxidized silicon as determ
✍ J.M. Hill; D.G. Royce; C.S. Fadley; L.F. Wagner; F.J. Grunthaner πŸ“‚ Article πŸ“… 1976 πŸ› Elsevier Science 🌐 English βš– 756 KB

## Silicon with thermally-grown oxide overlayers m the thickness range IS-89 A IS studied by angulardcpendent XPS. Electron attenuation lengths at 1382 eV are found to be 37 +-4 A in SiOz and 27 +-6 A in Si. Single-crystal effects and thin-layer anomalies are also discussed.