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Surface-sensitive Raman microscopy with total internal reflection illumination

✍ Scribed by Chris A. Michaels

Publisher
John Wiley and Sons
Year
2010
Tongue
English
Weight
345 KB
Volume
41
Category
Article
ISSN
0377-0486

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## Abstract In modern fluorescence microscopy, lasers are a widely used source of light, both for imaging in total internal reflection and epi‐illumination modes. In wide‐field imaging, scattering of highly coherent laser light due to imperfections in the light path typically leads to nonuniform il