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Measuring particle interactions with total internal reflection microscopy

✍ Scribed by John Y Walz


Publisher
Elsevier Science
Year
1997
Tongue
English
Weight
641 KB
Volume
2
Category
Article
ISSN
1359-0294

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## Abstract In modern fluorescence microscopy, lasers are a widely used source of light, both for imaging in total internal reflection and epi‐illumination modes. In wide‐field imaging, scattering of highly coherent laser light due to imperfections in the light path typically leads to nonuniform il