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Surface roughness induced electron mobility degradation in InAs nanowires

✍ Scribed by Wang, Fengyun; Yip, SenPo; Han, Ning; Fok, KitWa; Lin, Hao; Hou, Jared J; Dong, Guofa; Hung, TakFu; Chan, K S; Ho, Johnny C

No coin nor oath required. For personal study only.

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