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Surface roughness and electron backscattering in high aspect ratio silicon nanowires

✍ Scribed by G. Pennelli; M. Totaro; P. Bruschi

Publisher: Elsevier Science
Year: 2011
Tongue: English
Weight: 478 KB
Volume: 88
Category: Article
ISSN: 0167-9317
DOI: 10.1016/j.mee.2011.02.089

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