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Surface Residual Stress Measurement Using Curvature Interferometry

✍ Scribed by J. Wang; P. Shrotriya; K.-S. Kim

Book ID: 106574090
Publisher: Sage Publications
Year: 2006
Tongue: English
Weight: 459 KB
Volume: 46
Category: Article
ISSN: 0014-4851
DOI: 10.1007/s11340-006-5864-3

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