✦ LIBER ✦
Residual stress measurement in silicon sheet by shadow moiré interferometry
✍ Scribed by Y. Kwon; S. Danyluk; L. Bucciarelli; J.P. Kalejs
- Publisher
- Elsevier Science
- Year
- 1987
- Tongue
- English
- Weight
- 608 KB
- Volume
- 82
- Category
- Article
- ISSN
- 0022-0248
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