Surface quality inspection of PbWO4 crystals by grazing incidence X-ray diffraction

✍ Scribed by P. Mengucci; A. Di Cristoforo; M. Lebeau; G. Majni; N. Paone; P. Pietroni; D. Rinaldi

• Publisher: Elsevier Science
• Year: 2005
• Tongue: English
• Weight: 180 KB
• Volume: 537
• Category: Article
• ISSN: 0168-9002
• DOI: 10.1016/j.nima.2004.08.010

✦ Synopsis

High-quality scintillating crystals are required for applications in radiographic systems and high-energy physics detectors to achieve the specified optical properties. In order to study the state of the single crystals surface we propose the use of the grazing incidence X-ray diffraction (GID) technique. This technique allows performing a depth profiling of the sample by changing the incidence angle of the X-ray beam with respect to the sample surface. In this work, two samples of a large PbWO 4 (PWO) single crystal exhibiting different surface roughness values have been studied. Results have shown that GID is a suitable technique for surface quality inspection.