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Grazing incidence X-ray diffraction analysis of surface modified SiC layers

✍ Scribed by J. Neuhäuser; G. Treffer; H. Plänitz; W. Wagner; G. Marx

Publisher: Springer
Year: 1997
Tongue: English
Weight: 42 KB
Volume: 358
Category: Article
ISSN: 1618-2650
DOI: 10.1007/s002160050421

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