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Grazing Incidence X-ray Diffraction Study on Surface Crystal Structure of Polyethylene Thin Films

โœ Scribed by Hirohiko Yakabe; Keiji Tanaka; Toshihiko Nagamura; Sono Sasaki; Osami Sakata; Atsushi Takahara; Tisato Kajiyama


Publisher
Springer
Year
2005
Tongue
English
Weight
710 KB
Volume
53
Category
Article
ISSN
0170-0839

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High-quality scintillating crystals are required for applications in radiographic systems and high-energy physics detectors to achieve the specified optical properties. In order to study the state of the single crystals surface we propose the use of the grazing incidence X-ray diffraction (GID) tech