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Surface phonon polariton of wurtzite AlN thin film grown on sapphire

✍ Scribed by S.S. Ng; P.K. Ooi; S.C. Lee; Z. Hassan; H. Abu Hassan

Book ID
113784679
Publisher
Elsevier Science
Year
2012
Tongue
English
Weight
727 KB
Volume
134
Category
Article
ISSN
0254-0584

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Surface phonon polariton characteristics
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## Abstract In this work, p‐polarized far infrared attenuated total reflection (ATR) with Otto configuration technique is employed to study the surface phonon polariton (SPP) characteristics of wurtzite ZnO thin film grown on Si(111) substrate. One prominent dip corresponding to the leaky SPP mode

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Laue oscillations) appear close to the high-angle reflections. The film thickness can then be evaluated as: where W i and W i-1 are positions of adjacent satellite maxima.