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Surface leakage current related failure of power silicon devices operated at high junction temperature

✍ Scribed by K.I. Nuttall; O. Buiu; V.V.N. Obreja

Book ID: 108362003
Publisher: Elsevier Science
Year: 2003
Tongue: English
Weight: 848 KB
Volume: 43
Category: Article
ISSN: 0026-2714
DOI: 10.1016/s0026-2714(03)00325-1

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