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[IEEE IEEE International Symposium on Industrial Electronics, 2005. ISIE 2005. - Dubrovnik, Croatia (June 20-23, 2005)] Proceedings of the IEEE International Symposium on Industrial Electronics, 2005. ISIE 2005. - Reverse Current Instability of Power Silicon Diodes (Thyristors) at High Temperature and the Junction Surface Leakage Current

โœ Scribed by Obreja, V.V.N.; Codreanu, C.; Nuttall, K.I.; Buiu, O.

Book ID
111863859
Publisher
IEEE
Year
2005
Weight
201 KB
Volume
2
Category
Article
ISBN-13
9780780387386

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