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Surface Film Thickness Determination by Reflectance Measurements

โœ Scribed by Larson, D. T. ;Lott, L. A. ;Cash, D. L.


Book ID
115323528
Publisher
The Optical Society
Year
1973
Tongue
English
Weight
447 KB
Volume
12
Category
Article
ISSN
1559-128X

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We present a method for the non-destructive measurement of zeolite membrane characteristics by means of infrared (IR) reflectance measurements in the non-absorbing frequency range. A rigorous expression for the IR reflectivity of an isotropic layered structure is combined with a polynomial expansion