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Film thickness measurement by frustrated total reflection fluorescence

โœ Scribed by O.S. Heavens; D. Gingell

Publisher
Elsevier Science
Year
1991
Tongue
English
Weight
436 KB
Volume
23
Category
Article
ISSN
0030-3992

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๐Ÿ“œ SIMILAR VOLUMES

Time-resolved total internal reflection
Time-resolved total internal reflection fluorescence spectroscopy of polymer films
โœ Hiroshi Masuhara; Noboru Mataga; Shigeo Tazuke; Toshiro Murao; Iwao Yamazaki ๐Ÿ“‚ Article ๐Ÿ“… 1983 ๐Ÿ› Elsevier Science ๐ŸŒ English โš– 364 KB

Using total internal reflection, the possibility of a subnanosecond fluorescence spectroscopy for elucidating photophysical and photochemical processes of polymer surface is demonstrated\_ The thickness which can be studied under the present experimental conditions is of the order of 0.01 pm.