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Measurement of tantalum film thickness by anodization

✍ Scribed by CB Oliver; GEC Limited

Publisher
Elsevier Science
Year
1965
Tongue
English
Weight
147 KB
Volume
15
Category
Article
ISSN
0042-207X

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Ah&met-Data on optical reflectance and anodization voltage, obtained during the galvanostatic anodization of metallic niobium foils in an H,PG, (1%) solution at room temperature were simultaneously recorded as a function of time, to determine the thickness of the Nb,O, tihns formed. From these data,