Anodic niobium pentoxide films: growth and thickness determination by in situ optoelectrochemical measurements

✍ Scribed by J.F. Julião; J.W.R. Chagas; H.L. Cesar; N.L. Dias; Franco Decker; U.U. Gomes

• Publisher: Elsevier Science
• Year: 1991
• Tongue: English
• Weight: 361 KB
• Volume: 36
• Category: Article
• ISSN: 0013-4686
• DOI: 10.1016/0013-4686(91)80008-v

✦ Synopsis

Ah&met-Data on optical reflectance and anodization voltage, obtained during the galvanostatic anodization of metallic niobium foils in an H,PG, (1%) solution at room temperature were simultaneously recorded as a function of time, to determine the thickness of the Nb,O, tihns formed. From these data, plots of film thickness us anodization voltage were obtained. A linear relation was always observed and in all cases but one, an angular coefficient of 22AV' was verified.