Comments on the paper by J.F. Julião et al. on “anodic niobium pentoxide films: Growth and thickness determination by in situ optoelectrochemical measurements”

Anodic niobium pentoxide films: growth a

Anodic niobium pentoxide films: growth and thickness determination by in situ optoelectrochemical measurements

✍ J.F. Julião; J.W.R. Chagas; H.L. Cesar; N.L. Dias; Franco Decker; U.U. Gomes 📂 Article 📅 1991 🏛 Elsevier Science 🌐 English ⚖ 361 KB

Ah&met-Data on optical reflectance and anodization voltage, obtained during the galvanostatic anodization of metallic niobium foils in an H,PG, (1%) solution at room temperature were simultaneously recorded as a function of time, to determine the thickness of the Nb,O, tihns formed. From these data,