Surface characterization of SiC composites exposed to deuterium ions, using atomic force microscopy
β Scribed by N. Almqvist; M. Rubel; E. Franconi
- Publisher
- Elsevier Science
- Year
- 1995
- Tongue
- English
- Weight
- 930 KB
- Volume
- 201
- Category
- Article
- ISSN
- 0921-5093
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