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Surface analysis with high energy time-of-flight secondary ion mass spectrometry measured in parallel with PIXE and RBS

✍ Scribed by Brian N. Jones; Vladimir Palitsin; Roger Webb

Publisher: Elsevier Science
Year: 2010
Tongue: English
Weight: 441 KB
Volume: 268
Category: Article
ISSN: 0168-583X
DOI: 10.1016/j.nimb.2010.02.045

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