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Superconducting Multilayers: Microstructural Properties Studied by X-Ray Diffraction

✍ Scribed by Vailionis, A.; Brazdeikis, A.; FlodstrÖm, A.S.

Book ID: 111909600
Publisher: Cambridge University Press
Year: 1995
Weight: 870 KB
Volume: 382
Category: Article
ISSN: 0272-9172
DOI: 10.1557/proc-382-217

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