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Microstructural evolution of NiFe/Ag multilayers studied by X-ray diffraction and in situ high-resolution TEM

✍ Scribed by E. Snoeck; R. Sinclair; M.A. Parker; T.L. Hylton; K.R. Coffey; J.K. Howard; A. Lessmann; A.I. Bienenstock

Book ID: 113320972
Publisher: Elsevier Science
Year: 1995
Tongue: English
Weight: 619 KB
Volume: 151
Category: Article
ISSN: 0304-8853
DOI: 10.1016/0304-8853(95)00409-2

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