In situ thermal residual stress evolution in ultrathin ZnO and Ag films studied by synchrotron x-ray diffraction

✍ Scribed by P.O. Renault; C. Krauss; E. Le Bourhis; G. Geandier; A. Benedetto; S.Y. Grachev; E. Barthel

• Book ID: 113937180
• Publisher: Elsevier Science
• Year: 2011
• Tongue: English
• Weight: 373 KB
• Volume: 520
• Category: Article
• ISSN: 0040-6090
• DOI: 10.1016/j.tsf.2011.07.060