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studied by hard x-ray diffraction

✍ Scribed by Zimmermann, M. v.; Schneider, J. R.; Frello, T.; Andersen, N. H.; Madsen, J.; Käll, M.; Poulsen, H. F.; Liang, R.; Dosanjh, P.; Hardy, W. N.

Book ID: 120343780
Publisher: The American Physical Society
Year: 2003
Tongue: English
Weight: 297 KB
Volume: 68
Category: Article
ISSN: 1098-0121
DOI: 10.1103/PhysRevB.68.104515

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