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Sulfur passivation effect on HfO[sub 2]/GaAs interface: A first-principles study

✍ Scribed by Wang, Weichao; Gong, Cheng; Shan, Bin; Wallace, Robert M.; Cho, Kyeongjae

Book ID: 120303145
Publisher: American Institute of Physics
Year: 2011
Tongue: English
Weight: 655 KB
Volume: 98
Category: Article
ISSN: 0003-6951
DOI: 10.1063/1.3597219

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