𝔖 Bobbio Scriptorium
✦   LIBER   ✦

Sub-ångstrom resolution using aberration corrected electron optics

✍ Scribed by Batson, P. E.; Dellby, N.; Krivanek, O. L.

Book ID
109890460
Publisher
Nature Publishing Group
Year
2002
Tongue
English
Weight
690 KB
Volume
418
Category
Article
ISSN
0028-0836

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Probing structures of nanomaterials usin
Probing structures of nanomaterials using advanced electron microscopy methods, including aberration-corrected electron microscopy at the angstrom scale
✍ Pratibha L. Gai; Kenta Yoshida; Carla Shute; Xiaoting Jia; Michael Walsh; Michae 📂 Article 📅 2010 🏛 John Wiley and Sons 🌐 English ⚖ 863 KB

## Abstract Structural and compositional studies of nanomaterials of technological importance have been carried out using advanced electron microscopy methods, including aberration‐corrected transmission electron microscopy (AC‐TEM), AC‐high angle annular dark field scanning TEM (AC‐HAADF‐STEM), AC

Practical spatial resolution of electron
Practical spatial resolution of electron energy loss spectroscopy in aberration corrected scanning transmission electron microscopy
✍ A.B. Shah; Q.M. Ramasse; J.G. Wen; A. Bhattacharya; J.M. Zuo 📂 Article 📅 2011 🏛 Elsevier Science 🌐 English ⚖ 778 KB

The resolution of electron energy loss spectroscopy (EELS) is limited by delocalization of inelastic electron scattering rather than probe size in an aberration corrected scanning transmission electron microscope (STEM). In this study, we present an experimental quantification of EELS spatial resolu