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Resolution Quality and Atom Positions in Sub-Ångström Electron Microscopy

✍ Scribed by O'Keefe, M A; Allard, L F; Blom, D A

Book ID
120292835
Publisher
Cambridge University Press
Year
2005
Tongue
English
Weight
221 KB
Volume
11
Category
Article
ISSN
1431-9276

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## Abstract Advances in atomic resolution in situ environmental transmission electron microscopy for direct probing of gas‐solid reactions, including at very high temperatures (∼2000°C) are described. In addition, recent developments of dynamic real time in situ studies at the Angstrom level using