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Advances in atomic resolution in situ environmental transmission electron microscopy and 1Å aberration corrected in situ electron microscopy

✍ Scribed by Pratibha L. Gai; Edward D. Boyes

Publisher
John Wiley and Sons
Year
2009
Tongue
English
Weight
868 KB
Volume
72
Category
Article
ISSN
1059-910X

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✦ Synopsis

Abstract

Advances in atomic resolution in situ environmental transmission electron microscopy for direct probing of gas‐solid reactions, including at very high temperatures (∼2000°C) are described. In addition, recent developments of dynamic real time in situ studies at the Angstrom level using a hot stage in an aberration corrected environment are presented. In situ data from Pt/Pd nanoparticles on carbon with the corresponding FFT/optical diffractogram illustrate an achieved resolution of 0.11 nm at 500°C and higher in a double aberration corrected TEM/STEM instrument employing a wider gap objective pole piece. The new results open up opportunities for dynamic studies of materials in an aberration corrected environment. Microsc. Res. Tech., 2009. © 2009 Wiley‐Liss, Inc.

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