Practical spatial resolution of electron energy loss spectroscopy in aberration corrected scanning transmission electron microscopy

✍ Scribed by A.B. Shah; Q.M. Ramasse; J.G. Wen; A. Bhattacharya; J.M. Zuo

• Publisher: Elsevier Science
• Year: 2011
• Tongue: English
• Weight: 778 KB
• Volume: 42
• Category: Article
• ISSN: 0968-4328
• DOI: 10.1016/j.micron.2010.12.008

✦ Synopsis

The resolution of electron energy loss spectroscopy (EELS) is limited by delocalization of inelastic electron scattering rather than probe size in an aberration corrected scanning transmission electron microscope (STEM). In this study, we present an experimental quantification of EELS spatial resolution using chemically modulated 2×(LaMnO(3))/2×(SrTiO(3)) and 2×(SrVO(3))/2×(SrTiO(3)) superlattices by measuring the full width at half maxima (FWHM) of integrated Ti M(2,3), Ti L(2,3), V L(2,3), Mn L(2,3), La N(4,5), La N(2,3) La M(4,5) and Sr L(3) edges over the superlattices. The EELS signals recorded using large collection angles are peaked at atomic columns. The FWHM of the EELS profile, obtained by curve-fitting, reveals a systematic trend with the energy loss for the Ti, V, and Mn edges. However, the experimental FWHM of the Sr and La edges deviates significantly from the observed experimental tendency.