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Sub-micron strained Si:SiGe heterostructure MOSFETs

✍ Scribed by P.A. Clifton; S.J. Lavelle; A.G. O'Neill

Book ID: 104157810
Publisher: Elsevier Science
Year: 1997
Tongue: English
Weight: 795 KB
Volume: 28
Category: Article
ISSN: 0026-2692
DOI: 10.1016/s0026-2692(97)00007-4

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