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Study on the effect of annealing on the electrical properties of n-type cuprous oxide

โœ Scribed by Z. Xi; H. Zeng; N. Liao; L. Shi; H. Huang; S. Guo; N. Wang; D. Jin; L. Wang


Book ID
113937478
Publisher
Elsevier Science
Year
2012
Tongue
English
Weight
390 KB
Volume
520
Category
Article
ISSN
0040-6090

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