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Study on Multi-Frequency Method for Electrostatic Force Microscopy in Air

✍ Scribed by Li, C.; Ding, X. D.; Lin, G. C.

Book ID
120613680
Publisher
Taylor and Francis Group
Year
2013
Tongue
English
Weight
331 KB
Volume
145
Category
Article
ISSN
1058-4587

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The combination of ultrasound with atomic force microscopy (AFM) opens the high lateral resolution of scanning probe techniques in the nanometer range to ultrasonics. One possible method is to observe the resonance frequencies of the AFM sensors under different tip-sample interaction conditions. AFM