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Resonant multi-frequency method for Kelvin probe force microscopy in air

✍ Scribed by Ding, X D; Li, C; Liang, Z W; Lin, G C


Book ID
120381128
Publisher
Institute of Physics
Year
2012
Tongue
English
Weight
982 KB
Volume
23
Category
Article
ISSN
0957-0233

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The combination of ultrasound with atomic force microscopy (AFM) opens the high lateral resolution of scanning probe techniques in the nanometer range to ultrasonics. One possible method is to observe the resonance frequencies of the AFM sensors under different tip-sample interaction conditions. AFM