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Kelvin probe force microscopy for the characterization of semiconductor surfaces in chalcopyrite solar cells

✍ Scribed by Ch. Sommerhalter; S. Sadewasser; Th. Glatzel; Th.W. Matthes; A. Jäger-Waldau; M.Ch. Lux-Steiner

Book ID: 117215652
Publisher: Elsevier Science
Year: 2001
Tongue: English
Weight: 338 KB
Volume: 482-485
Category: Article
ISSN: 0039-6028
DOI: 10.1016/s0039-6028(01)00878-0

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